SHARE YOUR RESEARCH FINDINGS WITH MEASUREMENT EXPERTS WORLDWIDE!
New abstract submission deadline:
Thursday June 18th
Wednesday August 5th
STEP 1 / 6
GUIDELINES
- Is your abstract based on a completed or an ongoing project? All contributions are welcome! Just a few lines are enough to submit your abstract, see examples from previous edition here.
- Check all boxes that apply and complete the required fields in ENGLISH ONLY
- Provide an abstract between 200 and 500 words (see also evaluation criteria in the next step)
- Use one form per proposed lecture or poster presentation. We encourage having a different presenter for each presentation
- Ensure that you are available physically to present your lecture or poster in Lyon, if approved
- Reply to authors will be done by the end of September 2026. Final presentations are expected by mid February 2026.
- Accepted authors can publish a full article in "EDP Sciences" journal alongside the congress participation (to be confirmed). Complete articles will be requested for February 2027.
EVALUATION CRITERIA
- SCOPE: your abstract should present an innovative work in one of the proposed scientific and technological fields within the metrology world. Please refer to this year's themes in the next step.
- FORMAT: your submission should propose either an oral lecture or a poster presentation.
- EVALUATION: a committee of experts will evaluate your abstract based on several criteria including
❖ Scientific and/or technical quality,
❖ Interest for the congress / impact,
❖ Degree of innovation,
❖ TRL (Technology Readiness Level)
Based on the evaluation results and your preference, you will be included in the programme as a speaker, either for an oral or poster presentation.
KEY THEMES & FOCUS AREAS
The Congress will focus on the following topics with lecture sessions, round tables and a large exhibition including a scientific poster area dealing with the following topics:
The following types of proposals may be particularly encouraged: women speakers, authored by academics and cross-cutting topics.
