PROGRAM CIM2025
The CIM is the premier event where metrology intersects with science, industry and quality infrastructure organizations.
This 22nd edition promises another dynamic 4-day program, featuring parallel sessions tackling global challenges. 100% in english, with over 200 presentations covering oral and poster sessions, along with round tables, workshops, a short course and a variety of social events, the CIM continues to be a hub of cutting-edge discussions and networking opportunities.
Below, you'll find the short program as well as the detailed conference schedule ⤵️
We live in an era where face-to-face interactions are no longer the norm, and the products, services, and systems we depend on are becoming increasingly complex and digitalized. This transformation, in both scale and complexity, is unprecedented.
Technology is now deeply embedded in industrial processes and business models, transforming supply chains and integrating across all levels. With this digital evolution, ensuring quality and safety is more critical than ever.
Quality Infrastructure (QI) forms the foundation for development and safety assurance. It connects metrology, standardization, accreditation, conformity assessment, and market surveillance. For example, standardization enables economic efficiency and access to global markets by ensuring precise measurements and product verification. Accreditation adds another layer of confidence.
While industries have quickly adapted to the digital age, has QI evolved fast enough to stay relevant to markets, consumers, and regulators? Failing to bridge these gaps could risk QI becoming a barrier to innovation. We'll explore how QI is adapting, and look ahead to the future challenges and opportunities in maintaining trust and confidence in this digital landscape.
Moderator:
- Cristina Draghici - ISO / INTERNATIONAL
Speakers:
- Sascha Eichstädt - Physikalisch-Technische Bundesanstalt / GERMANY
- Hadi Hussain - ISO / INTERNATIONAL
- Patrick Mongillon - France Qualité / FRANCE
- Maureen Logghe - European Accreditation / INTERNATIONAL
- Martin Michelot - TIC Council / INTERNATIONAL
Session Chair: Michela Sega - Istituto Nazionale di Ricerca Metrologica / ITALY
In this plenary session, we will hear from international experts representing diverse fields. They will showcase international perspectives on how metrology is evolving to support sustainability in industry. Experts will highlight collaborative efforts between industry and government, the role of measurement science in driving innovation, reducing environmental impact and contributing to a greener, more responsible future.
Chairman and introduction:
Thomas Grenon - Laboratoire National de Métrologie et d'Essais / FRANCE
Speakers:
- Celebrating 150 years of the Metre Convention - providing measurements for all time for all people
Martin Milton - BIPM / INTERNATIONAL
- Smart measurements for a greener tomorrow: metrology meets sustainability
Dolores Del Campo - EURAMET / INTERNATIONAL
- Manufacturing architecture for resilience and sustainability
Cosimi Corleto - Horizon Europe Project Mars / INTERNATIONAL
Session Chair: Ivo Degiovanni - Istituto Nazionale di Ricerca Metrologica / ITALY
Session Chair: Fredrik Arrhen - RISE / SWEDEN
We are facing an increasing number of pollutants. Pharmaceuticals, pesticides or microplastics, pose significant threats to both the environment and human health and metrology can play a critical role in addressing them. Yet, our ability to detect, quantify and assess their impact is still limited. Accurate and reliable measurement techniques are essential to fully understand the scale of these risks. This round table aims to explore the current gaps in our measurement capabilities, the development of new metrological methods and the standards needed to ensure robust, reproducible data. By fostering collaboration between scientists, policymakers and industry, we can create solutions that will help protect our planet and ensure a healthier future for all.
Moderator:
- Robert Wielgosz – BIPM / INTERNATIONAL
Speakers:
- Nina Huynh - INERIS / FRANCE
- Flavia Nagy – Nestlé / SWITZERLAND
- Andrea Mario Giovannozzi – Istituto Nazionale di Ricerca Metrologica / ITALY
- Nathalie Guigues – Laboratoire National de Métrologie et d'Essais / FRANCE
- Toni Laurila – Sensmet / FINLAND
Session Chair: Florbela Dias - Instituto Português da Qualidade / PORTUGAL
Session Chair: Sascha Eichstädt - Physikalisch-Technische Bundesanstalt / GERMANY