PROGRAM CIM2025
The CIM is the premier event where metrology intersects with science, industry and quality infrastructure organizations.
This 22nd edition promises another dynamic 4-day program, featuring parallel sessions tackling global challenges. 100% in english, with over 200 presentations covering oral and poster sessions, along with round tables, workshops, a short course and a variety of social events, the CIM continues to be a hub of cutting-edge discussions and networking opportunities.
Below, you'll find the short program as well as the detailed conference schedule ⤵️
Metrology in the Digital Transformation of the international Quality Infrastructure
The green and digital transition challenge metrology and the quality infrastructure (QI). The QI-Digital initiative develops smart tools for a data-based QI, enabling new types of quality assurance, easing bureaucracy and unlocking billions in savings. The workshop focuses on digital certificates in metrology, their provisioning via data spaces and interoperability with the larger QI. We invite the international metrology community and industry to provide feedback and team up for joint activities.
9.00 - 10.30 - PART ONE
“QI-Digital” – idea, initiative and agenda of the workshop
- Dorothea Knopf – PTB / GERMANY
- Jens Niederhausen – PTB / GERMANY
M4AIM – Metrology for AI in Medicine
- Hans Rabus – PTB / GERMANY
TraCIM-AI – Platform for AI testing
- Maik Liebl – PTB / GERMANY
- Shanna Schönhals – PTB / GERMANY
- Michael Melzer – BAM / GERMANY
- Barbara Jung – PTB / GERMANY
- Daniel Hutzschenreuter – PTB / GERMANY
10.30 - 11.00 - COFFEE BREAK
11.00 - 12.30 - PART TWO
Digital Certificate of Conformity (D-CoC)
- Dorothea Knopf – PTB / GERMANY
Digital Product Passport
- Jens Niederhausen – PTB / GERMANY
- Jens Gayko - DKE / GERMANY
Panel Discussion “Current challenges in the transfer of QI-Digital results to practise”
Moderator:
- Sascha Eichstädt - PTB / GERMANY
Speakers:
- Thomas Engel - Siemens / GERMANY
- Jens Gayko - DKE / GERMANY
- Michael Mende - SPEKTRA Schwingungstechnik und Akustik GmbH / GERMANY
- Sami Koskinen - Beamex / FINLAND
12.30 – 1.30 Lunch for workshop participants ONLY
Pioneering precision in a digital world: Metrology's role in sustainability and industrial innovation. This year's the International Metrology Congress will explore how metrology plays a key role in advancing industrial innovation while driving sustainability efforts in a digital age.
Speakers:
- Thomas COURBE - DIRECTION GÉNÉRALE DES ENTREPRISES / FRANCE
- Martin MILTON - BIPM / INTERNATIONAL
- Cosimi CORLETO - CFM president / FRANCE
- Laurent LABATUT - TRESCAL / FRANCE
- Julie VOYER - GL EVENTS / FRANCE
The Internet of Measurement (IoM) is emerging as a crucial field in the era of IoT, focusing on accurate and synchronized measurements across connected devices. IoM ensures calibration, data collection, and analysis from sensors, guaranteeing precision through centralized management. By leveraging IoT technology, IoM supports real-time synchronization, ensuring measurements follow industry norms and remain reliable over time.
IoM enables centralized calibration management, using AI to monitor variations and manage device performance. Predictive maintenance becomes possible by tracking sensor data, calibration cycles, and detecting anomalies early. Additionally, IoM allows remote calibration updates, reducing manual interventions and enhancing the efficiency of devices in various environments.
The collaboration between IoT and metrology is essential, but the real challenge for IoM lies in creating global standards for measurement accuracy. As IoM evolves, it will define how industries trust and manage precise measurements, shaping the future of data integrity and operational reliability across all sectors.
Moderator:
- Olivier Moinecourt & David Riallant - OMWAVE by Groupe TERA / FRANCE
Speakers:
- Malek Abdi - Advarna / FRANCE
- Michael Mende - Spektra / GERMANY
- Shanna Schönhals - Physikalisch-Technische Bundesanstalt / GERMANY
- Julien Vigarié - HEX GROUP / FRANCE
- Maxence Bureau - ENGIE / FRANCE
- David Riallant - GROUPE TERA / FRANCE
Session Chair: Hugo Lehmann - METAS / SWITZERLAND
Session Chair: Fredrik Arrhen - RISE / SWEDEN
To wrap up the first day of the CIM, all participants are invited to gather at the Metrology Village within the exhibition hall. It's the perfect opportunity to relax, share a drink together and enjoy a cheerful and informal moment of connection!